Ashish Kumar Singh, Ku He, Constantine Caramanis, Michael Orshansky. Modeling and Optimization Techniques for Yield-Aware SRAM Post-Silicon Tuning. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(8):1159-1167, 2014. [doi]
@article{SinghHCO14,
title = {Modeling and Optimization Techniques for Yield-Aware SRAM Post-Silicon Tuning},
author = {Ashish Kumar Singh and Ku He and Constantine Caramanis and Michael Orshansky},
year = {2014},
doi = {10.1109/TCAD.2014.2317571},
url = {http://dx.doi.org/10.1109/TCAD.2014.2317571},
researchr = {https://researchr.org/publication/SinghHCO14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {33},
number = {8},
pages = {1159-1167},
}