Modeling and Optimization Techniques for Yield-Aware SRAM Post-Silicon Tuning - researchr publication

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Ashish Kumar Singh, Ku He, Constantine Caramanis, Michael Orshansky. Modeling and Optimization Techniques for Yield-Aware SRAM Post-Silicon Tuning. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(8):1159-1167, 2014. [doi]

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