Adit D. Singh, C. Mani Krishna. On optimizing VLSI testing for product quality using die-yield prediction. IEEE Trans. on CAD of Integrated Circuits and Systems, 12(5):695-709, 1993. [doi]
@article{SinghK93,
title = {On optimizing VLSI testing for product quality using die-yield prediction},
author = {Adit D. Singh and C. Mani Krishna},
year = {1993},
doi = {10.1109/43.277614},
url = {http://doi.ieeecomputersociety.org/10.1109/43.277614},
tags = {optimization, testing, C++},
researchr = {https://researchr.org/publication/SinghK93},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {12},
number = {5},
pages = {695-709},
}