Padmaraj Singh, David L. Landis, Vijaykrishnan Narayanan. Test Generation for Precise Interrupts on Out-of-Order Microprocessors. In 10th International Workshop on Microprocessor Test and Verification, MTV 2009, Austin, Texas, USA, 7-9 December 2009. pages 79-82, IEEE Computer Society, 2009. [doi]
Abstract is missing.