Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh. Binning for IC Quality: Experimental Studies on the SEMATECH Data. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 4-10, IEEE Computer Society, 1998.
Abstract is missing.