Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study - researchr publication authors

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Adit D. Singh, Phil Nigh, C. Mani Krishna. Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 362-369, IEEE Computer Society, 1997.

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