Adit D. Singh, Phil Nigh, C. Mani Krishna. Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 362-369, IEEE Computer Society, 1997.
@inproceedings{SinghNK97,
title = {Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study},
author = {Adit D. Singh and Phil Nigh and C. Mani Krishna},
year = {1997},
tags = {rule-based, C++},
researchr = {https://researchr.org/publication/SinghNK97},
cites = {0},
citedby = {0},
pages = {362-369},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}