Testability evaluation of sequential designs incorporating the multi-mode scannable memory element - researchr publication authors

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Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring. Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 286-293, IEEE Computer Society, 1999.

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