Abhay Singh, Milan Shetty, Srivaths Ravi, Ravindra Nibandhe. Methodology for early and accurate test power estimation at RTL. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 813, IEEE, 2010. [doi]
Abstract is missing.