Exploring sub-20nm FinFET design with predictive technology models

Saurabh Sinha, Greg Yeric, Vikas Chandra, Brian Cline, Yu Cao. Exploring sub-20nm FinFET design with predictive technology models. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 283-288, ACM, 2012. [doi]

Abstract

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