Corrado De Sio, Sarah Azimi, Luca Sterpone, David Merodio Codinachs. Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process. In Luca Cassano, Sreejit Chakravarty, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.