Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit - researchr publication authors

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Gontran Sion, Yves Blaquière, Yvon Savaria. Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 83-88, IEEE, 2015. [doi]

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