Gontran Sion, Yves Blaquière, Yvon Savaria. Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 83-88, IEEE, 2015. [doi]
@inproceedings{SionBS15,
title = {Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit},
author = {Gontran Sion and Yves Blaquière and Yvon Savaria},
year = {2015},
doi = {10.1109/IOLTS.2015.7229837},
url = {http://dx.doi.org/10.1109/IOLTS.2015.7229837},
researchr = {https://researchr.org/publication/SionBS15},
cites = {0},
citedby = {0},
pages = {83-88},
booktitle = {21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7905-2},
}