Panagiotis Sismanoglou, Dimitris Nikolos. Test data compression based on reuse and bit-flipping of parts of dictionary entries. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 110-115, IEEE, 2014. [doi]
@inproceedings{SismanoglouN14,
title = {Test data compression based on reuse and bit-flipping of parts of dictionary entries},
author = {Panagiotis Sismanoglou and Dimitris Nikolos},
year = {2014},
doi = {10.1109/DDECS.2014.6868773},
url = {http://dx.doi.org/10.1109/DDECS.2014.6868773},
researchr = {https://researchr.org/publication/SismanoglouN14},
cites = {0},
citedby = {0},
pages = {110-115},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4560-3},
}