Test data compression based on reuse and bit-flipping of parts of dictionary entries - researchr publication related

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Panagiotis Sismanoglou, Dimitris Nikolos. Test data compression based on reuse and bit-flipping of parts of dictionary entries. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 110-115, IEEE, 2014. [doi]

The following publications are possibly variants of this publication:

Test data compression based on the reuse of parts of the dictionary entriesP. Sismanoglou, Dimitris Nikolos. icecsys 2011: 538-541 [doi]

Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic ApproachesPanagiotis Sismanoglou, Dimitris Nikolos. tcad, 32(11):1762-1775, 2013. [doi]

Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword ReusabilityXrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos. tcad, 27(7):1333-1338, 2008. [doi]

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