Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams. Changing the Scan Enable during Shift. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 73-78, IEEE Computer Society, 2004. [doi]
@inproceedings{SitchinavaSKGNW04,
title = {Changing the Scan Enable during Shift},
author = {Nodari Sitchinava and Samitha Samaranayake and Rohit Kapur and Emil Gizdarski and Frederic Neuveux and Thomas W. Williams},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340073abs.htm},
researchr = {https://researchr.org/publication/SitchinavaSKGNW04},
cites = {0},
citedby = {0},
pages = {73-78},
booktitle = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2134-7},
}