Emil Gizdarski - researchr alias

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Viewing Publication 1 - 22 from 22

2017

A New Paradigm for Synthesis of Linear DecompressorsEmil Gizdarski, Peter Wohl, John A. Waicukauski. dac 2017: [doi]

2014

A shared memory based parallel diagnosis systemX. Cai, Emil Gizdarski, D. Landau. vts 2014: 1-6 [doi]

Two-Step Dynamic Encoding for Linear DecompressorsEmil Gizdarski. ats 2014: 330-335 [doi]

2011

Construction and Analysis of Augmented Time CompactorsEmil Gizdarski. et, 27(2):109-122, 2011. [doi]

2010

Constructing augmented time compactorsEmil Gizdarski. ets 2010: 151-156 [doi]

Fully X-tolerant, very high scan compressionPeter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski. dac 2010: 362-367 [doi]

2008

Constructing Augmented Multimode CompactorsEmil Gizdarski. vts 2008: 29-34 [doi]

2007

Minimizing the Impact of Scan CompressionPeter Wohl, John A. Waicukauski, Rohit Kapur, S. Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini. vts 2007: 67-74 [doi]

2005

Hierarchical Compactor Design for Diagnosis in Deterministic Logic BISTPeter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew. vts 2005: 359-365 [doi]

2004

2003

A Reconfigurable Shared Scan-in ArchitectureSamitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams. vts 2003: 9-14 [doi]

2002

Fault Set Partition for Efficient Width CompressionEmil Gizdarski, Hideo Fujiwara. ats 2002: 194-199 [doi]

SPIRIT: a highly robust combinational test generation algorithmEmil Gizdarski, Hideo Fujiwara. tcad, 21(12):1446-1458, 2002. [doi]

Sequential Circuits with Combinational Test Generation Complexity under Single-Fault AssumptionMichiko Inoue, Emil Gizdarski, Hideo Fujiwara. et, 18(1):55-62, 2002. [doi]

2001

SPIRIT: A Highly Robust Combinational Test Generation AlgorithmEmil Gizdarski, Hideo Fujiwara. vts 2001: 346-351 [doi]

A Framework for Low Complexity Static LearningEmil Gizdarski, Hideo Fujiwara. dac 2001: 546-549 [doi]

2000

Detection of Delay Faults in Memory Address DecodersEmil Gizdarski. et, 16(4):381-387, 2000. [doi]

Spirit: satisfiability problem implementation for redundancy identification and test generationEmil Gizdarski, Hideo Fujiwara. ats 2000: 171-178 [doi]

A class of sequential circuits with combinational test generation complexity under single-fault assumptionMichiko Inoue, Emil Gizdarski, Hideo Fujiwara. ats 2000: 398-403 [doi]

1996

Built-in self-test for folded bit-line Mbit DRAMsEmil Gizdarski. integration, 21(1-2):95-112, 1996. [doi]

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