Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams. A Reconfigurable Shared Scan-in Architecture. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 9-14, IEEE Computer Society, 2003. [doi]
Abstract is missing.