Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel. NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 997-998, IEEE, 2018. [doi]
@inproceedings{SivadasanSHCA18,
title = {NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI},
author = {Ajith Sivadasan and Riddhi Jitendrakumar Shah and Vincent Huard and Florian Cacho and Lorena Anghel},
year = {2018},
doi = {10.23919/DATE.2018.8342154},
url = {https://doi.org/10.23919/DATE.2018.8342154},
researchr = {https://researchr.org/publication/SivadasanSHCA18},
cites = {0},
citedby = {0},
pages = {997-998},
booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
publisher = {IEEE},
isbn = {978-3-9819263-0-9},
}