Estimation and optimization of reliability of noisy digital circuits

Satish Sivaswamy, Kia Bazargan, Marc D. Riedel. Estimation and optimization of reliability of noisy digital circuits. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 213-219, IEEE, 2009. [doi]

Authors

Satish Sivaswamy

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Kia Bazargan

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Marc D. Riedel

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