Satish Sivaswamy, Kia Bazargan, Marc D. Riedel. Estimation and optimization of reliability of noisy digital circuits. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 213-219, IEEE, 2009. [doi]
@inproceedings{SivaswamyBR09, title = {Estimation and optimization of reliability of noisy digital circuits}, author = {Satish Sivaswamy and Kia Bazargan and Marc D. Riedel}, year = {2009}, doi = {10.1109/ISQED.2009.4810296}, url = {http://dx.doi.org/10.1109/ISQED.2009.4810296}, tags = {optimization, reliability}, researchr = {https://researchr.org/publication/SivaswamyBR09}, cites = {0}, citedby = {0}, pages = {213-219}, booktitle = {10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA}, publisher = {IEEE}, }