HOLMES: Capturing the Yield-Optimized Design Space Boundaries of Analog and RF Integrated Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Bart De Smedt, Georges G. E. Gielen. HOLMES: Capturing the Yield-Optimized Design Space Boundaries of Analog and RF Integrated Circuits. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 10256-10263, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Bart De Smedt' in GoogleThis author has not been identified. Look up 'Georges G. E. Gielen' in Google

runs on WebDSL