Bart De Smedt, Georges G. E. Gielen. HOLMES: Capturing the Yield-Optimized Design Space Boundaries of Analog and RF Integrated Circuits. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 10256-10263, IEEE Computer Society, 2003. [doi]
Abstract is missing.