Jerry M. Soden, Christopher L. Henderson. IC Diagnosis: Industry Issues. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 435, IEEE Computer Society, 1997.
@inproceedings{SodenH97,
title = {IC Diagnosis: Industry Issues},
author = {Jerry M. Soden and Christopher L. Henderson},
year = {1997},
researchr = {https://researchr.org/publication/SodenH97},
cites = {0},
citedby = {0},
pages = {435},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}