Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, DongSu Lee, Hangyun Jung, Hanki Jeoung, Ki Won Lee, Junsuk Park, Jongeun Lee, ByungHyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Jang Seok Choi, Byung-Sick Moon, Jung Hwan Choi, Byungchul Kim, Seong-Jin Jang, Joo-Sun Choi, Kyungseok Oh. A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme. In 2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012. pages 38-40, IEEE, 2012. [doi]
@inproceedings{SohnNSSBKLJJLPLLJPPCKCCJCMCKJCO12,
title = {A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme},
author = {Kyomin Sohn and Taesik Na and Indal Song and Yong Shim and Wonil Bae and Sanghee Kang and DongSu Lee and Hangyun Jung and Hanki Jeoung and Ki Won Lee and Junsuk Park and Jongeun Lee and ByungHyun Lee and Inwoo Jun and Juseop Park and Junghwan Park and Hundai Choi and Sanghee Kim and Haeyoung Chung and Young Choi and Dae-Hee Jung and Jang Seok Choi and Byung-Sick Moon and Jung Hwan Choi and Byungchul Kim and Seong-Jin Jang and Joo-Sun Choi and Kyungseok Oh},
year = {2012},
doi = {10.1109/ISSCC.2012.6176868},
url = {http://dx.doi.org/10.1109/ISSCC.2012.6176868},
researchr = {https://researchr.org/publication/SohnNSSBKLJJLPLLJPPCKCCJCMCKJCO12},
cites = {0},
citedby = {0},
pages = {38-40},
booktitle = {2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0376-7},
}