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IP Session on Machine Learning Applications in IC Test-Related Tasks

Ghada Sokar, Yassien Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos. IP Session on Machine Learning Applications in IC Test-Related Tasks. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1, IEEE, 2019. [doi]

Authors

Ghada Sokar

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Yassien Zakaria

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Asmaa Rabie

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Kareem Madkour

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Ira Leventhal

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Jochen Rivoir

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Xinli Gu

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Haralampos-G. D. Stratigopoulos

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