IP Session on Machine Learning Applications in IC Test-Related Tasks

Ghada Sokar, Yassien Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos. IP Session on Machine Learning Applications in IC Test-Related Tasks. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1, IEEE, 2019. [doi]

Abstract

Abstract is missing.