High performance fault tolerance through predictive instruction re-execution

Jyothish Soman, Timothy M. Jones 0001. High performance fault tolerance through predictive instruction re-execution. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-4, IEEE, 2017. [doi]

Authors

Jyothish Soman

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Timothy M. Jones 0001

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