Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements - researchr publication authors

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Ahish Mysore Somashekar, Spyros Tragoudas. Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 481-486, IEEE, 2013. [doi]

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