Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes - researchr publication authors

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Hanna Soneda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu. Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes. In 2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019. pages 1-5, IEEE, 2019. [doi]

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