RLDA: Valid test pattern identification by machine learning classification method for VLSI test

Tai Song, Zhengfeng Huang, Xiaohui Guo. RLDA: Valid test pattern identification by machine learning classification method for VLSI test. Microelectronics Journal, 128:105549, 2022. [doi]

Authors

Tai Song

This author has not been identified. Look up 'Tai Song' in Google

Zhengfeng Huang

This author has not been identified. Look up 'Zhengfeng Huang' in Google

Xiaohui Guo

This author has not been identified. Look up 'Xiaohui Guo' in Google