Tai Song, Zhengfeng Huang, Xiaohui Guo. RLDA: Valid test pattern identification by machine learning classification method for VLSI test. Microelectronics Journal, 128:105549, 2022. [doi]
@article{SongHG22-0,
title = {RLDA: Valid test pattern identification by machine learning classification method for VLSI test},
author = {Tai Song and Zhengfeng Huang and Xiaohui Guo},
year = {2022},
doi = {10.1016/j.mejo.2022.105549},
url = {https://doi.org/10.1016/j.mejo.2022.105549},
researchr = {https://researchr.org/publication/SongHG22-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {128},
pages = {105549},
}