Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park. Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. on Circuits and Systems, 56-II(1):56-60, 2009. [doi]
@article{SongHYJP09,
title = {Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults},
author = {Jaehoon Song and Juhee Han and Hyunbean Yi and Taejin Jung and Sungju Park},
year = {2009},
doi = {10.1109/TCSII.2008.2010168},
url = {http://dx.doi.org/10.1109/TCSII.2008.2010168},
researchr = {https://researchr.org/publication/SongHYJP09},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {56-II},
number = {1},
pages = {56-60},
}