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Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park. Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. on Circuits and Systems, 56-II(1):56-60, 2009. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Highly Compact Interconnect Test Patterns for Crosstalk and Static FaultsJaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park. tcas, 56-II(5):419-423, 2009. [doi] Efficient Interconnect Test Patterns for Crosstalk and Static FaultsP. Min, H. Yi, J. Song, S. Baeg, S. Park. tcad, 25(11):2605-2608, 2006. [doi]
The following publications are possibly variants of this publication: