Package test interface fixture considering low cost solution, high electrical performance, and compatibility with fine pitch packages

Ki-Jae Song, Hunkyo Seo, Sang-hyun Ko. Package test interface fixture considering low cost solution, high electrical performance, and compatibility with fine pitch packages. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 606-614, IEEE, 2010. [doi]

Abstract

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