Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia. A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 140-147, IEEE, 2004. [doi]
@inproceedings{SongSWX04, title = {A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current}, author = {Peilin Song and Franco Stellari and Alan J. Weger and Tian Xia}, year = {2004}, doi = {10.1109/ITC.2004.20}, url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.20}, tags = {rule-based, model-based diagnostics, meta-model, diagnostics, Meta-Environment}, researchr = {https://researchr.org/publication/SongSWX04}, cites = {0}, citedby = {0}, pages = {140-147}, booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA}, publisher = {IEEE}, isbn = {0-7803-8581-0}, }