A sensitivity analysis of microarray feature selection and classification under measurement noise - researchr publication authors

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Herman M. J. Sontrop, René van den Ham, Perry D. Moerland, Marcel J. T. Reinders, Wim F. J. Verhaegh. A sensitivity analysis of microarray feature selection and classification under measurement noise. In 2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSiPS 2009, Minneapolis, MN, USA, May 17-21, 2009. pages 1-4, IEEE, 2009. [doi]

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