Herman M. J. Sontrop, René van den Ham, Perry D. Moerland, Marcel J. T. Reinders, Wim F. J. Verhaegh. A sensitivity analysis of microarray feature selection and classification under measurement noise. In 2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSiPS 2009, Minneapolis, MN, USA, May 17-21, 2009. pages 1-4, IEEE, 2009. [doi]
@inproceedings{SontropHMRV09,
title = {A sensitivity analysis of microarray feature selection and classification under measurement noise},
author = {Herman M. J. Sontrop and René van den Ham and Perry D. Moerland and Marcel J. T. Reinders and Wim F. J. Verhaegh},
year = {2009},
doi = {10.1109/GENSIPS.2009.5174352},
url = {http://dx.doi.org/10.1109/GENSIPS.2009.5174352},
researchr = {https://researchr.org/publication/SontropHMRV09},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSiPS 2009, Minneapolis, MN, USA, May 17-21, 2009},
publisher = {IEEE},
}