Warin Sootkaneung, Suppachai Howimanporn, Sasithorn Chookaew. Thermal Effect on Performance, Power, and BTI Aging in FinFET-Based Designs. In Hana Kubátová, Martin Novotný, Amund Skavhaug, editors, Euromicro Conference on Digital System Design, DSD 2017, Vienna, Austria, August 30 - Sept. 1, 2017. pages 345-351, IEEE, 2017. [doi]
Abstract is missing.