Soft error reduction through gate input dependent weighted sizing in combinational circuits

Warin Sootkaneung, Kewal K. Saluja. Soft error reduction through gate input dependent weighted sizing in combinational circuits. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 603-610, IEEE, 2011. [doi]

Abstract

Abstract is missing.