José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Thomas W. Williams. Fault Modeling and Defect Level Projections in Digital ICs. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 436-442, IEEE Computer Society, 1994.
@inproceedings{SousaGTW94,
title = {Fault Modeling and Defect Level Projections in Digital ICs},
author = {José T. de Sousa and Fernando M. Gonçalves and João Paulo Teixeira and Thomas W. Williams},
year = {1994},
tags = {modeling},
researchr = {https://researchr.org/publication/SousaGTW94},
cites = {0},
citedby = {0},
pages = {436-442},
booktitle = {EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France},
editor = {Robert Werner},
publisher = {IEEE Computer Society},
isbn = {0-8186-5410-4},
}