Analyzing the Single Event Upset Vulnerability of Binarized Neural Networks on SRAM FPGAs - researchr publication

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Ioanna Souvatzoglou, Athanasios Papadimitriou, Aitzan Sari, Vasileios Vlagkoulis, Mihalis Psarakis. Analyzing the Single Event Upset Vulnerability of Binarized Neural Networks on SRAM FPGAs. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-6, IEEE, 2021. [doi]

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