Michelly de Souza, Sylvain Barraud, Mikaël Cassé, Maud Vinet, Olivier Faynot, Marcelo Antonio Pavanello. Experimental Assessment of Variability in Junctionless Nanowire nMOS Transistors. In 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021. pages 223-226, IEEE, 2021. [doi]
Abstract is missing.