The Best of Both Worlds: Model-Driven Engineering Meets Model-Based Testing

P. H. M. van Spaendonck, Tim A. C. Willemse. The Best of Both Worlds: Model-Driven Engineering Meets Model-Based Testing. In Guillermo A. Pérez 0001, Jean-François Raskin, editors, 34th International Conference on Concurrency Theory, CONCUR 2023, September 18-23, 2023, Antwerp, Belgium. Volume 279 of LIPIcs, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 2023. [doi]

Abstract

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