Improving Path Delay Fault Testability by Path Removal

Uwe Sparmann, Lars Köller. Improving Path Delay Fault Testability by Path Removal. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 200-209, IEEE Computer Society, 1998. [doi]

Authors

Uwe Sparmann

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Lars Köller

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