Uwe Sparmann, Lars Köller. Improving Path Delay Fault Testability by Path Removal. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 200-209, IEEE Computer Society, 1998. [doi]
@inproceedings{SparmannK98,
title = {Improving Path Delay Fault Testability by Path Removal},
author = {Uwe Sparmann and Lars Köller},
year = {1998},
url = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360200.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/SparmannK98},
cites = {0},
citedby = {0},
pages = {200-209},
booktitle = {16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8436-4},
}