Jim Sproch. A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1437, IEEE, 2004. [doi]
@inproceedings{Sproch04,
title = {A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals},
author = {Jim Sproch},
year = {2004},
doi = {10.1109/ITC.2004.16},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.16},
tags = {testing},
researchr = {https://researchr.org/publication/Sproch04},
cites = {0},
citedby = {0},
pages = {1437},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}