A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals

Jim Sproch. A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1437, IEEE, 2004. [doi]

Abstract

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