Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Aswin Sreedhar, Sandip Kundu. On linewidth-based yield analysis for nanometer lithography. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 381-386, IEEE, 2009. [doi]
Abstract is missing.