T. Sridhar. A New Parallel Test Approach for Large Memories. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 462-470, IEEE Computer Society, 1985.
@inproceedings{Sridhar85,
title = {A New Parallel Test Approach for Large Memories},
author = {T. Sridhar},
year = {1985},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/Sridhar85},
cites = {0},
citedby = {0},
pages = {462-470},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}